Invention Grant
- Patent Title: Assessing a lead based on high-frequency response
- Patent Title (中): 基于高频响应评估潜在客户
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Application No.: US12915828Application Date: 2010-10-29
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Publication No.: US08644932B2Publication Date: 2014-02-04
- Inventor: Kevin R. Seifert , Christopher C. Stancer
- Applicant: Kevin R. Seifert , Christopher C. Stancer
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agent Michael J. Ostrom
- Main IPC: A61N1/37
- IPC: A61N1/37

Abstract:
In general, this disclosure is directed to techniques and circuitry to determine characteristics of an implantable lead associated with an implantable medical device (IMD). The implantable lead may be designed to be MRI-safe by having one or more components that attenuate frequencies associated with an MRI that, if left unreduced, may interfere with the performance of the lead and/or cause harm to the tissue in which the lead is implanted. The circuitry may transmit a signal through the lead and receive a response signal. The device may determine the lead characteristics by comparing the transmitted signal with the received signal. In addition to determining whether the lead is MRI-safe, the techniques of this disclosure may be also utilized to determine whether the lead is faulty.
Public/Granted literature
- US20120109246A1 ASSESSING A LEAD BASED ON HIGH-FREQUENCY RESPONSE Public/Granted day:2012-05-03
Information query
IPC分类: