Invention Grant
US08645093B2 Calibrating multi-dimensional sensor for offset, sensitivity, and non-orthogonality 有权
校准多维传感器,用于偏移,灵敏度和非正交性

Calibrating multi-dimensional sensor for offset, sensitivity, and non-orthogonality
Abstract:
A multi-dimensional sensor, a magnetometer or accelerometer, is calibrated based on the raw data provided by the sensor. Raw data is collected and may be used to generate ellipse or ellipsoid parameters, for a two-dimensional or three-dimensional sensor, respectively. An offset calibration factor is calculated based on the raw data, e.g., the determined ellipse or ellipsoid parameters. A sensitivity calibration factor is then calculated based on the offset calibration factor and the raw data. A non-orthogonality calibration factor can then be calculated based on the calculated offset and sensitivity calibration factors. Using the offset, sensitivity and non-orthogonality calibration factors, the raw data can be corrected to produce calibrated data.
Information query
Patent Agency Ranking
0/0