Invention Grant
US08645093B2 Calibrating multi-dimensional sensor for offset, sensitivity, and non-orthogonality
有权
校准多维传感器,用于偏移,灵敏度和非正交性
- Patent Title: Calibrating multi-dimensional sensor for offset, sensitivity, and non-orthogonality
- Patent Title (中): 校准多维传感器,用于偏移,灵敏度和非正交性
-
Application No.: US12612563Application Date: 2009-11-04
-
Publication No.: US08645093B2Publication Date: 2014-02-04
- Inventor: Christopher Brunner
- Applicant: Christopher Brunner
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Jennifer M. Pascua
- Main IPC: G01D3/02
- IPC: G01D3/02 ; G01S3/74 ; G01R33/025

Abstract:
A multi-dimensional sensor, a magnetometer or accelerometer, is calibrated based on the raw data provided by the sensor. Raw data is collected and may be used to generate ellipse or ellipsoid parameters, for a two-dimensional or three-dimensional sensor, respectively. An offset calibration factor is calculated based on the raw data, e.g., the determined ellipse or ellipsoid parameters. A sensitivity calibration factor is then calculated based on the offset calibration factor and the raw data. A non-orthogonality calibration factor can then be calculated based on the calculated offset and sensitivity calibration factors. Using the offset, sensitivity and non-orthogonality calibration factors, the raw data can be corrected to produce calibrated data.
Public/Granted literature
- US20110106477A1 CALIBRATING MULTI-DIMENSIONAL SENSOR FOR OFFSET, SENSITIVITY, AND NON-ORTHOGONALITY Public/Granted day:2011-05-05
Information query