Invention Grant
- Patent Title: Synchronous multi-temperature sensor for semiconductor integrated circuits
- Patent Title (中): 半导体集成电路同步多温度传感器
-
Application No.: US12946928Application Date: 2010-11-16
-
Publication No.: US08645095B2Publication Date: 2014-02-04
- Inventor: Seong Seop Lee , Saeng Hwan Kim
- Applicant: Seong Seop Lee , Saeng Hwan Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Patent Ltd.
- Priority: KR10-2010-0017336 20100225
- Main IPC: G06F3/01
- IPC: G06F3/01 ; G06F3/00 ; G06F3/02 ; G06F3/023

Abstract:
A temperature sensor includes a counting signal generation unit, a counting signal decoding unit, an input reference voltage selection unit, and a latch pulse generation unit. The counting signal generation unit is configured to generate one or more counting signals in response to an oscillation signal. The counting signal decoding unit is configured to decode the one or more counting signals and to generate one or more test selection signals and an end signal. The input reference voltage selection unit is configured to output a first selection reference voltage or a second selection reference voltage as an input reference voltage in response to the one or more test selection signals. The latch pulse generation unit is configured to generate one or more latch pulses in response to the one or more test selection signals.
Public/Granted literature
- US20110208471A1 SYNCHRONOUS MULTI-TEMPERATURE SENSOR FOR SEMICONDUCTOR INTEGRATED CIRCUITS Public/Granted day:2011-08-25
Information query