Invention Grant
- Patent Title: Deflection measuring system and method
- Patent Title (中): 挠度测量系统及方法
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Application No.: US13023780Application Date: 2011-02-09
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Publication No.: US08645096B2Publication Date: 2014-02-04
- Inventor: Brock Matthew Lape , William Gene Newman , Stuart Alan Oliver
- Applicant: Brock Matthew Lape , William Gene Newman , Stuart Alan Oliver
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: G06F15/00
- IPC: G06F15/00
Abstract:
A deflection measurement probe includes a body portion having a cavity defined by the body portion, a first positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface, and a second positional measurement sensor disposed in the cavity of the body portion, the first positional measurement sensor including a sensor tip extending from the body portion operative to contact a measurement surface.
Public/Granted literature
- US20120203499A1 Deflection Measuring System and Method Public/Granted day:2012-08-09
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