Invention Grant
- Patent Title: Critical threshold parameters for defining bursts in event logs
- Patent Title (中): 用于在事件日志中定义突发的临界阈值参数
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Application No.: US13286473Application Date: 2011-11-01
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Publication No.: US08645311B2Publication Date: 2014-02-04
- Inventor: Bibudh Lahiri , Fabian Moerchen , Ioannis Akrotirianakis
- Applicant: Bibudh Lahiri , Fabian Moerchen , Ioannis Akrotirianakis
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Main IPC: G06F17/00
- IPC: G06F17/00

Abstract:
Systems and methods for determining critical thresholds on a number of events (k) and a window length (t) for properly defining a burst of events in a data stream. A new coverage metric Ck,t is defined and used in the determination, where the coverage metric Ck,t is defined for a particular pair (k,t) as a fraction, with the numerator defined a number of events that occur within some (k,t)-bursty window and the denominator defined as the total number of events (n) that occurred along the entire time span being analyzed. Coverage metric Ck,t is monotonic non-increasing in k and monotonic non-decreasing in t, allowing for a divide-and-conquer search strategy to be used to find the critical threshold pairs (k*, t*).
Public/Granted literature
- US20120246109A1 Critical Threshold Parameters for Defining Bursts in Event Logs Public/Granted day:2012-09-27
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