Invention Grant
- Patent Title: Estimating temporal degradation of non-volatile solid-state memory
- Patent Title (中): 估计非易失性固态存储器的时间退化
-
Application No.: US13173962Application Date: 2011-06-30
-
Publication No.: US08645773B2Publication Date: 2014-02-04
- Inventor: Ryan James Goss , David Scott Seekins , Mark Allen Gaertner
- Applicant: Ryan James Goss , David Scott Seekins , Mark Allen Gaertner
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Hillingsworth Davis, LLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F13/00
Abstract:
Representative locations of a non-volatile, solid-state memory of an apparatus store characterization data. An event during which elapsed time is not measured by the apparatus is determined. In response to the event, temporal degradation of the non-volatile, solid-state memory during the event is estimated based on electrical characteristics of the representative locations.
Public/Granted literature
- US20130007543A1 ESTIMATING TEMPORAL DEGRADATION OF NON-VOLATILE SOLID-STATE MEMORY Public/Granted day:2013-01-03
Information query
