Invention Grant
- Patent Title: Expedited memory drive self test
- Patent Title (中): 快速记忆体自检
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Application No.: US13323991Application Date: 2011-12-13
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Publication No.: US08645774B2Publication Date: 2014-02-04
- Inventor: Timothy J. Louie , Adam Roberts
- Applicant: Timothy J. Louie , Adam Roberts
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Biggers Kennedy Lenart Spraggins LLP
- Agent H. Barrett Spraggins; Katherine S. Brown
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Expedited memory drive self test, including: determining, by a drive self test module, a base block size for testing a memory drive; determining, by a drive self test module, a block group size for testing a memory drive; determining, by the drive self test module, a percentage of the memory drive to test; and for each block group size of memory in the memory drive: testing for media defects, by the drive self test module, a number of blocks in a block group that corresponds to the percentage of the memory drive to test.
Public/Granted literature
- US20130151913A1 Expedited Memory Drive Self Test Public/Granted day:2013-06-13
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