Invention Grant
- Patent Title: Methodology for performing post layer generation check
- Patent Title (中): 执行后期生成检查的方法
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Application No.: US13234117Application Date: 2011-09-15
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Publication No.: US08645876B2Publication Date: 2014-02-04
- Inventor: Wye Boon Loh , Jeoung Mo Koo , Paul Kim Cheong Soh , Beng Lye Oh , Purakh Raj Verma
- Applicant: Wye Boon Loh , Jeoung Mo Koo , Paul Kim Cheong Soh , Beng Lye Oh , Purakh Raj Verma
- Applicant Address: unknown Singapore
- Assignee: Globalfoundries Singapore Pte. Ltd.
- Current Assignee: Globalfoundries Singapore Pte. Ltd.
- Current Assignee Address: unknown Singapore
- Agency: Horizon IP Pte. Ltd.
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
There is provided a method comprising receiving data corresponding to a layout design for a plurality of input mask layers and generating a layout design for at least one generated mask layer. The relationship between a first geometric element in a first layout pattern comprising one or more of the generated mask layers and a second geometric element in a second layout pattern is then determined and verified to check if they comply with predetermined rules. If the relationship does not conform with the predetermined rules the design of at least one of the generated mask layers associated with the first or second layout pattern is modified.
Public/Granted literature
- US20130074016A1 METHODOLOGY FOR PERFORMING POST LAYER GENERATION CHECK Public/Granted day:2013-03-21
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