Invention Grant
US08645896B1 Method to transfer failure analysis-specific data between design houses and fab's/FA labs
失效
在设计公司和工厂/ FA实验室之间转移故障分析特定数据的方法
- Patent Title: Method to transfer failure analysis-specific data between design houses and fab's/FA labs
- Patent Title (中): 在设计公司和工厂/ FA实验室之间转移故障分析特定数据的方法
-
Application No.: US13232796Application Date: 2011-09-14
-
Publication No.: US08645896B1Publication Date: 2014-02-04
- Inventor: Hitesh Suri , Catharine L. Kardach
- Applicant: Hitesh Suri , Catharine L. Kardach
- Applicant Address: US CA Fremont
- Assignee: DCG Systems Inc
- Current Assignee: DCG Systems Inc
- Current Assignee Address: US CA Fremont
- Agent Deborah W. Wenocur
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method and system for an IC design house to transfer design and layout information to a fabrication or failure analysis facility on a need-to-know basis to enable effective failure analysis while not providing unnecessary or extraneous information.
Information query
