Invention Grant
- Patent Title: Robust self testing of a motion sensor system
- Patent Title (中): 运动传感器系统的稳健自检
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Application No.: US12754251Application Date: 2010-04-05
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Publication No.: US08646308B2Publication Date: 2014-02-11
- Inventor: Michael Mueck
- Applicant: Michael Mueck
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01P21/00
- IPC: G01P21/00
Abstract:
A method for self-testing a dual-mass linear accelerometer in which a self-test voltage is applied to urge the two masses to move in opposite directions. Self-test signals are then applied to obtain a differential mode signal to detect masses repositioned in opposing directions. During testing, common disturbances to the two masses are rejected as common mode signals.
Public/Granted literature
- US20100251800A1 Robust Self Testing of a Motion Sensor System Public/Granted day:2010-10-07
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