Invention Grant
- Patent Title: Apparatus and methods for temperature calibration and sensing
- Patent Title (中): 用于温度校准和感测的装置和方法
-
Application No.: US13470790Application Date: 2012-05-14
-
Publication No.: US08646969B2Publication Date: 2014-02-11
- Inventor: Dong Pan
- Applicant: Dong Pan
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G01K7/00
- IPC: G01K7/00

Abstract:
Some embodiments include apparatus and methods having a first switch, a second switch, and a circuit coupled to the first and second switches. The first switch may be configured to switch between an on-state and an off-state based on a value of a first current flowing through a number of resistors and a diode coupled in series with the resistors. The second switch may be configured to switch between the on-state and the off-state based on a value of a second current on a circuit path. The second current is a function of a voltage at a node between two of the resistors and a resistance of the circuit path. The circuit may be configured to provide a temperature reading based on the number of times the first switch or the second switch switches between the on-state and the off-state during a time interval.
Public/Granted literature
- US20120224605A1 APPARATUS AND METHODS FOR TEMPERATURE CALIBRATION AND SENSING Public/Granted day:2012-09-06
Information query