Invention Grant
US08648398B2 Electronic device and a transistor including a trench and a sidewall doped region
有权
电子器件和包括沟槽和侧壁掺杂区域的晶体管
- Patent Title: Electronic device and a transistor including a trench and a sidewall doped region
- Patent Title (中): 电子器件和包括沟槽和侧壁掺杂区域的晶体管
-
Application No.: US13627287Application Date: 2012-09-26
-
Publication No.: US08648398B2Publication Date: 2014-02-11
- Inventor: Jaume Roig-Guitart , Peter Moens , Marnix Tack
- Applicant: Jaume Roig-Guitart , Peter Moens , Marnix Tack
- Applicant Address: US AZ Phoenix
- Assignee: Semiconductor Components Industries, LLC
- Current Assignee: Semiconductor Components Industries, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Abel Law Group, LLP
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
An electronic device can include a first layer having a primary surface, a well region lying adjacent to the primary surface, and a buried doped region spaced apart from the primary surface and the well region. The electronic device can also include a trench extending towards the buried doped region, wherein the trench has a sidewall, and a sidewall doped region along the sidewall of the trench, wherein the sidewall doped region extends to a depth deeper than the well region. The first layer and the buried region have a first conductivity type, and the well region has a second conductivity type opposite that of the first conductivity type. The electronic device can include a conductive structure within the trench, wherein the conductive structure is electrically connected to the buried doped region and is electrically insulated from the sidewall doped region. Processes for forming the electronic device are also described.
Public/Granted literature
- US20130020637A1 ELECTRONIC DEVICE AND A TRANSISTOR INCLUDING A TRENCH AND A SIDEWALL DOPED REGION Public/Granted day:2013-01-24
Information query
IPC分类: