Invention Grant
US08648609B2 Testing system and adapter thereof utilizing a common power supply and display device to test different main board circuits
有权
测试系统及其适配器利用公共电源和显示设备来测试不同的主板电路
- Patent Title: Testing system and adapter thereof utilizing a common power supply and display device to test different main board circuits
- Patent Title (中): 测试系统及其适配器利用公共电源和显示设备来测试不同的主板电路
-
Application No.: US12879614Application Date: 2010-09-10
-
Publication No.: US08648609B2Publication Date: 2014-02-11
- Inventor: Kai-Fu Shi , Zhen-Wu Xu
- Applicant: Kai-Fu Shi , Zhen-Wu Xu
- Applicant Address: TW Taipei Hsien
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW Taipei Hsien
- Agency: Steptoe & Johnson LLP
- Priority: CN200910180155 20091109
- Main IPC: H01H31/02
- IPC: H01H31/02 ; G01R31/02
Abstract:
A testing system utilizing a common power supply and a display device to test different types of a main board circuit is disclosed. The testing system includes a power supply device for outputting a predetermined power; a liquid crystal display for receiving a control signal from the main board circuit to perform a testing procedure; and an adapter. The adapter includes a first circuit coupled electrically between the power supply device and the main board circuit for converting the predetermined power into a power needed by the main board circuit, and a second circuit coupled electrically between the main board circuit and the liquid crystal display for converting a control signal generated by the main board circuit into a signal format required to perform the testing procedure on the liquid crystal display.
Public/Granted literature
Information query
