Invention Grant
- Patent Title: Interferometric material sensing apparatus including adjustable coupling and associated methods
- Patent Title (中): 干涉材料感测装置包括可调耦合和相关方法
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Application No.: US13102686Application Date: 2011-05-06
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Publication No.: US08649022B2Publication Date: 2014-02-11
- Inventor: Robert M. Montgomery , Randy L. Carmean , Charles Franklin Middleton, IV , James G. Tonti
- Applicant: Robert M. Montgomery , Randy L. Carmean , Charles Franklin Middleton, IV , James G. Tonti
- Applicant Address: US FL Melbourne
- Assignee: Harris Corporation
- Current Assignee: Harris Corporation
- Current Assignee Address: US FL Melbourne
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B9/02
Abstract:
A material sensing apparatus comprises an excitation source configured to induce waves in a workpiece, and an optical waveguide interferometer configured to sense the induced waves in the workpiece. The optical waveguide interferometer comprises a probe segment having a probe segment end, and an adjustable coupler configured to permit setting a gap between the probe segment end and the workpiece. A controller is coupled to the adjustable coupler and configured to set the gap between the probe segment end and the workpiece.
Public/Granted literature
- US20120281229A1 INTERFEROMETRIC MATERIAL SENSING APPARATUS INCLUDING ADJUSTABLE COUPLING AND ASSOCIATED METHODS Public/Granted day:2012-11-08
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