Invention Grant
- Patent Title: Calibrating field uniformity
- Patent Title (中): 校准场均匀性
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Application No.: US12512934Application Date: 2009-07-30
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Publication No.: US08649076B2Publication Date: 2014-02-11
- Inventor: Peter Majewicz
- Applicant: Peter Majewicz
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H04N1/46
- IPC: H04N1/46 ; H04N1/04 ; G06F3/12 ; G03F3/08 ; H04N1/40 ; G06T5/00 ; H04N1/60 ; G06K15/00 ; G09G3/10 ; H04N3/14 ; G06K9/00

Abstract:
Systems and methods systems and methods for calibrating field uniformity are disclosed. An exemplary method includes scanning the imaging area including a first media to obtain optical data for a specular reflectance map. The method also includes scanning the imaging area including a second media to obtain optical data for a diffuse reflective map. The method also includes storing the specular reflectance map and the diffuse reflective map for adjusting actual pixel values during an imaging operation.
Public/Granted literature
- US20110026087A1 CALIBRATING FIELD UNIFORMITY Public/Granted day:2011-02-03
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