Invention Grant
US08649137B2 Semiconductor device and method of forming same for ESD protection 有权
用于ESD保护的半导体器件及其形成方法

Semiconductor device and method of forming same for ESD protection
Abstract:
In an embodiment a circuit provides protection against electrostatic discharge (ESD). A shunt device is controlled to provide a current bypass upon the occurrence of an ESD event. A trigger circuit controls operation of the shunt device and includes an inverter and a hysteresis means to prevent oscillation of the trigger circuit. A reference is used to trigger the control circuit and has a time constant associated with it to distinguish between power up events and ESD events.
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