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US08649235B2 Semiconductor memory device and operating method thereof 有权
半导体存储器件及其操作方法

Semiconductor memory device and operating method thereof
Abstract:
A semiconductor memory device includes an enable fuse unit configured to generate a repair enable signal corresponding to a cutting state of an enable fuse after a power-up operation starts, and an address fuse unit enabled in response to the repair enable signal, and configured to generate an output signal in response to an external address and whether or not an address fuse is programmed.
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