Invention Grant
US08649236B2 Circuit and method for controlling leakage current in random access memory devices
有权
用于控制随机存取存储器件中的漏电流的电路和方法
- Patent Title: Circuit and method for controlling leakage current in random access memory devices
- Patent Title (中): 用于控制随机存取存储器件中的漏电流的电路和方法
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Application No.: US13105274Application Date: 2011-05-11
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Publication No.: US08649236B2Publication Date: 2014-02-11
- Inventor: Chung Zen Chen , Ying Wei Jan , Jian Shiang Liang
- Applicant: Chung Zen Chen , Ying Wei Jan , Jian Shiang Liang
- Applicant Address: TW Hsinchu
- Assignee: Elite Semiconductor Memory Technology Inc.
- Current Assignee: Elite Semiconductor Memory Technology Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Stites & Harbison PLLC
- Agent Juan Carlos A. Marquez, Esq.
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A circuit for controlling leakage current in random access memory devices comprises a pre-charge equalization circuit. The pre-charge equalization circuit provides a pre-charge voltage to a pair of complementary bit lines of a memory cell of a random access memory device in accordance with a pre-charge signal. When the memory cell is in a self-refresh mode, the pre-charge signal is activated by a periodically triggered pre-charge request and also activated before and after the memory cell is self-refreshed.
Public/Granted literature
- US20120287739A1 CIRCUIT AND METHOD FOR CONTROLLING LEAKAGE CURRENT IN RANDOM ACCESS MEMORY DEVICES Public/Granted day:2012-11-15
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