Invention Grant
- Patent Title: Methods and devices for quantitative analysis of X-ray images
- Patent Title (中): 用于X射线图像定量分析的方法和装置
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Application No.: US13251750Application Date: 2011-10-03
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Publication No.: US08649481B2Publication Date: 2014-02-11
- Inventor: Philipp Lang , Daniel Steines
- Applicant: Philipp Lang , Daniel Steines
- Applicant Address: US MA Bedford
- Assignee: ImaTx, Inc.
- Current Assignee: ImaTx, Inc.
- Current Assignee Address: US MA Bedford
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01B15/02
- IPC: G01B15/02
Abstract:
The present invention relates to network enabled analysis of x-ray images. Also described are devices comprising calibration phantoms; methods of using these devices; methods of formulating databases containing information regarding x-ray images; the databases themselves; and methods of manipulating the information and databases.
Public/Granted literature
- US20120087468A1 Methods and Devices for Quantitative Analysis of X-Ray Images Public/Granted day:2012-04-12
Information query
