Invention Grant
- Patent Title: Method for measuring the deformation of a specimen using a fiber optic extensometer
- Patent Title (中): 使用光纤伸缩计测量样品变形的方法
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Application No.: US13611159Application Date: 2012-09-12
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Publication No.: US08649638B2Publication Date: 2014-02-11
- Inventor: Nikhil Gupta , Nguyen Quang Nguyen
- Applicant: Nikhil Gupta , Nguyen Quang Nguyen
- Applicant Address: US NY Brooklyn
- Assignee: Polytechnic Institute of New York University
- Current Assignee: Polytechnic Institute of New York University
- Current Assignee Address: US NY Brooklyn
- Agency: Smith Risley Tempel Santos LLC
- Agent Laurence P. Colton
- Main IPC: G02B6/00
- IPC: G02B6/00

Abstract:
A method for measuring the deformation of a specimen using an extensometer having a loop of a single-mode optical fiber. At least two points of the loop are attached to desired locations on a specimen. Light is transmitted through the loop and the transmitted optical power is measured by a photodetector. The deformation of the specimen causes the size and shape of the loop to change, which changes the transmitted optical power. The change in optical power is related to extension or compression using calibration curves. The sensor works on the principle of transmitted power modulation through the curved section.
Public/Granted literature
- US20130240718A1 METHOD FOR MEASURING THE DEFORMATION OF A SPECIMEN USTING A FIBER OPTIC EXTENSOMETER Public/Granted day:2013-09-19
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