Invention Grant
US08649995B2 System and method for efficient test case generation using input dependency information
有权
使用输入依赖信息有效测试用例生成的系统和方法
- Patent Title: System and method for efficient test case generation using input dependency information
- Patent Title (中): 使用输入依赖信息有效测试用例生成的系统和方法
-
Application No.: US13216542Application Date: 2011-08-24
-
Publication No.: US08649995B2Publication Date: 2014-02-11
- Inventor: Nair Pradosh Thulasidasan , Tenkarai Sankaran Venkataramanan
- Applicant: Nair Pradosh Thulasidasan , Tenkarai Sankaran Venkataramanan
- Applicant Address: IN Bangalore
- Assignee: Infosys Technologies, Ltd.
- Current Assignee: Infosys Technologies, Ltd.
- Current Assignee Address: IN Bangalore
- Agency: LeClairRyan, a Professional Corporation
- Priority: IN1218/CHE/2011 20110407
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A system and method for providing an efficient test case generator is disclosed. A test case project is established upon request from a user, via a user interface, to test an item. The test case project includes a plurality of fields and corresponding designated values to be tested. A first set of identified fields of the plurality are received, wherein the first set includes two or more fields identified by the user as having a dependent relationship with at least one another. A first relational field cluster for the first set of related fields and their values is created. A test case generation technique is performed on the first relational field cluster to compute all relevant test conditions for the first relation field cluster. Results of the computed test conditions for the first relational field cluster are displayed to the user via the user interface.
Public/Granted literature
- US20120259576A1 SYSTEM AND METHOD FOR EFFICIENT TEST CASE GENERATION USING INPUT DEPENDENCY INFORMATION Public/Granted day:2012-10-11
Information query