Invention Grant
- Patent Title: Validation process for fault detection of a device
- Patent Title (中): 设备故障检测的验证过程
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Application No.: US12373961Application Date: 2007-06-29
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Publication No.: US08650003B2Publication Date: 2014-02-11
- Inventor: Joseph Regnard De Lagny , Abdelmalik Belaid
- Applicant: Joseph Regnard De Lagny , Abdelmalik Belaid
- Applicant Address: FR Boulogne-Billancourt
- Assignee: RENAULT s.a.s.
- Current Assignee: RENAULT s.a.s.
- Current Assignee Address: FR Boulogne-Billancourt
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0606472 20060717
- International Application: PCT/FR2007/051564 WO 20070629
- International Announcement: WO2008/009835 WO 20080124
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
A process for validating the fault detection of a device under test includes carrying out a series of basic tests of the device under test. Each basic test leads to a positive or negative result indicating normal or abnormal functioning of the device under test. The process also includes, after each realization of a basic test, updating an event counter (CRT) and updating a result counter (FCRT). Validation is performed depending on test result once the event counter has reached a first maximal value (CTRmax) or once the realization counter has reached a second maximal value (FCTRmax). The process can be performed by a diagnostic device. The process and device can monitor the electric or functional performance of more or less complex systems installed in an automobile.
Public/Granted literature
- US20100049473A1 VALIDATION PROCESS FOR FAULT DETECTION OF A DEVICE Public/Granted day:2010-02-25
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