Invention Grant
- Patent Title: Error recovery within integrated circuit
- Patent Title (中): 集成电路内的错误恢复
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Application No.: US12926084Application Date: 2010-10-25
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Publication No.: US08650470B2Publication Date: 2014-02-11
- Inventor: Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge , David Bull
- Applicant: Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge , David Bull
- Applicant Address: GB Cambridge US MI Ann Arbor
- Assignee: ARM Limited,The Regents of the University of Michigan
- Current Assignee: ARM Limited,The Regents of the University of Michigan
- Current Assignee Address: GB Cambridge US MI Ann Arbor
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
An integrated circuit includes one or more portions having error detection and error correction circuits and which is operated with operating parameters giving finite non-zero error rate as well as one or more portions formed and operated to provide a zero error rate.
Public/Granted literature
- US20110107166A1 Error recovery within integrated circuit Public/Granted day:2011-05-05
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