Invention Grant
- Patent Title: Surface texture measuring machine and a surface texture measuring method
- Patent Title (中): 表面纹理测量机和表面纹理测量方法
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Application No.: US12900867Application Date: 2010-10-08
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Publication No.: US08650939B2Publication Date: 2014-02-18
- Inventor: Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
- Applicant: Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
- Applicant Address: JP Kawasaki-Shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Oliff PLC
- Priority: JP2009-236121 20091013; JP2009-236123 20091013; JP2009-236124 20091013; JP2009-236125 20091013
- Main IPC: G01B5/20
- IPC: G01B5/20 ; G01B11/24 ; G01B21/04

Abstract:
A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.
Public/Granted literature
- US20110083497A1 SURFACE TEXTURE MEASURING MACHINE AND A SURFACE TEXTURE MEASURING METHOD Public/Granted day:2011-04-14
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