Invention Grant
- Patent Title: Planar probe head and ultrasonic testing device and method for a component
- Patent Title (中): 平面探针头和超声波检测装置及方法
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Application No.: US13127430Application Date: 2009-11-03
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Publication No.: US08650959B2Publication Date: 2014-02-18
- Inventor: Walter Franz De Odorico , Roman Heinrich Koch , Wolfgang Haase
- Applicant: Walter Franz De Odorico , Roman Heinrich Koch , Wolfgang Haase
- Applicant Address: DE
- Assignee: GE Sensing & Inspection Technologies
- Current Assignee: GE Sensing & Inspection Technologies
- Current Assignee Address: DE
- Agency: Global Patent Operation
- Agent Mark A. Conklin
- Priority: DE102008037516 20081103
- International Application: PCT/EP2009/064564 WO 20091103
- International Announcement: WO2010/060759 WO 20100603
- Main IPC: G01N29/28
- IPC: G01N29/28

Abstract:
A planar probe for the coupling of ultrasonic signals to a planar component to be tested by means of water-free jet technology is provided. The planar probe includes: at least one preflow chamber; a flow chamber located downstream of at least one preflow chamber, wherein the flow chamber extends through a slot-shaped water outlet opening to a lower surface of the planar probe; a probe, wherein a lateral surface of the probe comprises emitting/receiving elements and forms an inner wall section of the flow chamber; a base body for the reception of the probe; and a sliding plate comprising the slot-shaped water outlet opening, whose planar extension along the component is larger than the planar extension of the base body along the component, wherein the planar probe is connected to the sliding plate.
Public/Granted literature
- US20110283799A1 Planar Probe Head and Ultrasonic Testing Device and Method for a Component Public/Granted day:2011-11-24
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