Invention Grant
- Patent Title: Testing apparatus
- Patent Title (中): 测试仪器
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Application No.: US13473679Application Date: 2012-05-17
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Publication No.: US08650964B2Publication Date: 2014-02-18
- Inventor: Wei-Min Qin , Cong-Xu Hu , Yu-Lin Liu
- Applicant: Wei-Min Qin , Cong-Xu Hu , Yu-Lin Liu
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201110402877 20111207
- Main IPC: G01B5/30
- IPC: G01B5/30 ; G01B7/16 ; G01L1/00 ; G01N3/00
Abstract:
A testing apparatus includes a retaining panel, a screw pole, two securing panels moveably attached to the screw pole, and two mounting members. Each of the two securing panels is slidably attached to the retaining panel. Each of the two mounting member is engaged with each of the two securing panels. The two securing panels are moveable relative to the screw pole for sandwiching an electronic device, and each of the two mounting member is engaged with the screw pole, for prevent the two securing panels from disengaged from the electronic device.
Public/Granted literature
- US20130145860A1 TESTING APPARATUS Public/Granted day:2013-06-13
Information query
