Invention Grant
US08653657B2 Semiconductor chip, method of manufacturing semiconductor chip, and semiconductor device
有权
半导体芯片,半导体芯片的制造方法以及半导体装置
- Patent Title: Semiconductor chip, method of manufacturing semiconductor chip, and semiconductor device
- Patent Title (中): 半导体芯片,半导体芯片的制造方法以及半导体装置
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Application No.: US11990875Application Date: 2006-08-18
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Publication No.: US08653657B2Publication Date: 2014-02-18
- Inventor: Osamu Miyata , Tadahiro Morifuji
- Applicant: Osamu Miyata , Tadahiro Morifuji
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Rabin & Berdo, P.C.
- Priority: JP2005-241520 20050823; JP2005-241521 20050823
- International Application: PCT/JP2006/316264 WO 20060818
- International Announcement: WO2007/023747 WO 20070301
- Main IPC: H01L29/40
- IPC: H01L29/40

Abstract:
There are provided a semiconductor device capable of accurately determining whether a semiconductor chip is bonded to a solid-state device such as the other semiconductor chip parallelly with each other, a semiconductor chip used for the semiconductor device, and a method of manufacturing the semiconductor chip. The semiconductor chip includes a functional bump projected with a first projection amount from the surface of the semiconductor chip and electrically connecting the semiconductor chip to the solid-state device, and a connection confirmation bump projected with a second projection amount, which is smaller than the first projection amount, from the surface of the semiconductor chip and used for confirming the state of the electrical connection by the functional bump.
Public/Granted literature
- US20090127705A1 Semiconductor chip, method of manufacturing semiconductor chip, and semiconductor device Public/Granted day:2009-05-21
Information query
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