Invention Grant
- Patent Title: Temperature control device and temperature control method
- Patent Title (中): 温度控制装置和温度控制方法
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Application No.: US13272018Application Date: 2011-10-12
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Publication No.: US08653843B2Publication Date: 2014-02-18
- Inventor: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- Applicant: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2003-294615 20030818
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/20

Abstract:
Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.
Public/Granted literature
- US20120025856A1 TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD Public/Granted day:2012-02-02
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