Invention Grant
- Patent Title: Voltage change detection device
- Patent Title (中): 电压变化检测装置
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Application No.: US12912192Application Date: 2010-10-26
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Publication No.: US08653865B2Publication Date: 2014-02-18
- Inventor: Kikuo Utsuno
- Applicant: Kikuo Utsuno
- Applicant Address: JP
- Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee Address: JP
- Agency: Studebaker & Brackett PC
- Priority: JP2009-289255 20091221
- Main IPC: H03L7/00
- IPC: H03L7/00

Abstract:
A voltage change detection device is provided, which can reduce a deviation of a detection potential and can detect a voltage change within a predetermined detection potential even when the threshold voltage of a field effect transistor is deviated. The voltage change detection device includes a first field effect transistor, a second field effect transistor, and a detection signal generator. The first field effect transistor has a drain connected to a power supply potential, a source connected to a first constant current source or a first resistor at a first node, and a gate connected to a fixed voltage. The second field effect transistor has a drain and a gate connected to the power supply potential and a source connected to a second constant current source or a second resistor at a second node. The detection signal generator generates a detection signal indicating that the power supply potential has crossed a predetermined detection potential according to a comparison between a voltage at the first node and a voltage at the second node.
Public/Granted literature
- US20110148472A1 VOLTAGE CHANGE DETECTION DEVICE Public/Granted day:2011-06-23
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