Invention Grant
- Patent Title: Amplifier calibration
- Patent Title (中): 放大器校准
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Application No.: US13656551Application Date: 2012-10-19
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Publication No.: US08653890B1Publication Date: 2014-02-18
- Inventor: Abdulrhman M. S. Ahmed , Paul R Hart , Ramanujam Shinidhi Embar
- Applicant: Freescale Semiconductor, Inc.
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: H03F3/68
- IPC: H03F3/68

Abstract:
A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. An attenuation of the first amplification path is set to a first attenuation value and an attenuation of the second amplification path is set to the first attenuation value. A first phase shift of the first amplification path and a second phase shift of the second amplification path that meets a first performance criteria is determined. A phase shift of the first amplification path is set to the first phase shift and a phase shift of the second amplification path is set to the second phase shift. A first attenuation of the first amplification path and a second attenuation of the second amplification path that meets a second performance criteria is determined.
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