Invention Grant
- Patent Title: Disturb-free static random access memory cell
- Patent Title (中): 无噪音静态随机存取存储单元
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Application No.: US13149489Application Date: 2011-05-31
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Publication No.: US08654575B2Publication Date: 2014-02-18
- Inventor: Xiaowei Deng
- Applicant: Xiaowei Deng
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Rose Alyssa Keagy; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A solid-state memory in which each memory cell includes a cross-point addressable write element. Each memory cell includes a storage element, such as a pair of cross-coupled inverters, and a read buffer for coupling one of the storage nodes to a read bit line for the column containing the cell. The write element of each memory cell includes one or a pair of write select transistors controlled by a write word line for the row containing the cell, and write pass transistors connected to corresponding storage nodes and connected in series with a write select transistor. The write pass transistors are gated by a write bit line for the column containing the cell. In operation, a write reference is coupled to one of the storage nodes of a memory cell in the selected column and the selected row, depending on the data state carried by the complementary write bit lines for that column.
Public/Granted literature
- US20120014173A1 Disturb-Free Static Random Access Memory Cell Public/Granted day:2012-01-19
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