Invention Grant
US08654575B2 Disturb-free static random access memory cell 有权
无噪音静态随机存取存储单元

  • Patent Title: Disturb-free static random access memory cell
  • Patent Title (中): 无噪音静态随机存取存储单元
  • Application No.: US13149489
    Application Date: 2011-05-31
  • Publication No.: US08654575B2
    Publication Date: 2014-02-18
  • Inventor: Xiaowei Deng
  • Applicant: Xiaowei Deng
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Rose Alyssa Keagy; W. James Brady; Frederick J. Telecky, Jr.
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Disturb-free static random access memory cell
Abstract:
A solid-state memory in which each memory cell includes a cross-point addressable write element. Each memory cell includes a storage element, such as a pair of cross-coupled inverters, and a read buffer for coupling one of the storage nodes to a read bit line for the column containing the cell. The write element of each memory cell includes one or a pair of write select transistors controlled by a write word line for the row containing the cell, and write pass transistors connected to corresponding storage nodes and connected in series with a write select transistor. The write pass transistors are gated by a write bit line for the column containing the cell. In operation, a write reference is coupled to one of the storage nodes of a memory cell in the selected column and the selected row, depending on the data state carried by the complementary write bit lines for that column.
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