Invention Grant
US08654590B2 Nonvolatile memory device performing a program verification with sense signals based on program data of adjacent memory cells and program method thereof 有权
基于相邻存储单元的程序数据,利用感测信号执行程序验证的非易失性存储器件及其编程方法

  • Patent Title: Nonvolatile memory device performing a program verification with sense signals based on program data of adjacent memory cells and program method thereof
  • Patent Title (中): 基于相邻存储单元的程序数据,利用感测信号执行程序验证的非易失性存储器件及其编程方法
  • Application No.: US13331820
    Application Date: 2011-12-20
  • Publication No.: US08654590B2
    Publication Date: 2014-02-18
  • Inventor: Seiichi AritomeSoon Ok Seo
  • Applicant: Seiichi AritomeSoon Ok Seo
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2010-0134639 20101224
  • Main IPC: G11C16/34
  • IPC: G11C16/34
Nonvolatile memory device performing a program verification with sense signals based on program data of adjacent memory cells and program method thereof
Abstract:
A programming method of a nonvolatile memory device includes inputting even data and odd data to be programmed into even memory cells coupled to even bit lines and odd memory cells coupled to odd bit lines, respectively, setting a sense signal as a first sense signal or a second sense signal having a lower voltage level than the first sense signal, based on odd data of odd memory cells adjacent to each of the even memory cells to be programmed, programming the even data into the even memory cells by supplying a program voltage, performing a program verify operation on each of the even memory cells in response to the set sense signal, and programming the odd data into the odd memory cells by supplying a program voltage.
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