Invention Grant
- Patent Title: Walk-through imaging system having vertical linear x-ray source
- Patent Title (中): 具有垂直线性X射线源的直通成像系统
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Application No.: US13171676Application Date: 2011-06-29
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Publication No.: US08654919B2Publication Date: 2014-02-18
- Inventor: John Michael Sabol , Lawrence E. Murphy , Kadri Nizar Jabri , Anila Lingamneni , Scott William Robinson , David L. Widmann
- Applicant: John Michael Sabol , Lawrence E. Murphy , Kadri Nizar Jabri , Anila Lingamneni , Scott William Robinson , David L. Widmann
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Ziolkowski Patent Solutions Group, SC
- Main IPC: A61B6/02
- IPC: A61B6/02

Abstract:
A system and method for acquiring x-ray imaging data from a subject is disclosed. The x-ray imaging system includes a first support structure oriented in a vertical fashion and a second support structure oriented in a vertical fashion and spaced apart from the first support structure to define a scanning area configured to receive a subject to be scanned. A linear x-ray source is affixed to the first support structure on one side of the scanning area and is oriented in a vertical fashion, with the linear x-ray source configured to emit x-rays towards the subject. A linear detector arrangement is affixed to the second support structure on another side of the scanning area and is generally opposite the linear x-ray source. The linear detector arrangement is configured to receive x-rays after passing through the subject.
Public/Granted literature
- US20120128124A1 WALK-THROUGH IMAGING SYSTEM HAVING VERTICAL LINEAR X-RAY SOURCE Public/Granted day:2012-05-24
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