Invention Grant
- Patent Title: Method and system for ontology candidate selection, comparison, and alignment
- Patent Title (中): 本体候选选择,比较和对齐的方法和系统
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Application No.: US13221974Application Date: 2011-08-31
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Publication No.: US08655882B2Publication Date: 2014-02-18
- Inventor: Donald R. Kretz , William D. Phillips , Bruce E. Peoples , Justin W. Toennies
- Applicant: Donald R. Kretz , William D. Phillips , Bruce E. Peoples , Justin W. Toennies
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/30

Abstract:
A system for ontology candidate selection and comparison including a microprocessor and an ontology candidate selection component executing on the microprocessor and configured to compare at least a portion of a plurality of ontology candidates based on a candidate selection rule, and based on said comparison, select from the plurality of ontology candidates a pair of ontologies. The system further includes an ontology similarity component coupled to the ontology candidate selection component and configured to generate a similarity outcome related to the pair of ontologies based on a similarity rule and evaluate at least one of: the candidate selection rule or the similarity rule based on the similarity outcome.
Public/Granted literature
- US20130054621A1 METHOD AND SYSTEM FOR ONTOLOGY CANDIDATE SELECTION, COMPARISON, AND ALIGNMENT Public/Granted day:2013-02-28
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