Invention Grant
- Patent Title: Technique for monitoring activity within an integrated circuit
- Patent Title (中): 集成电路内监控活动的技术
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Application No.: US12042992Application Date: 2008-03-05
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Publication No.: US08656411B2Publication Date: 2014-02-18
- Inventor: Lance E. Hacking
- Applicant: Lance E. Hacking
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/46
Abstract:
A technique to monitor events within a computer system or integrated circuit. In one embodiment, a software-accessible event monitoring storage and hardware-specific monitoring logic are selectable and their corresponding outputs may be monitored by accessing a counter to count events corresponding to each of software-accessible storage and hardware-specific monitoring logic.
Public/Granted literature
- US20090228902A1 Technique for Monitoring Activity within an Integrated Circuit Public/Granted day:2009-09-10
Information query
