Invention Grant
- Patent Title: Method of manufacturing GaN-based film
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Application No.: US13643206Application Date: 2011-11-10
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Publication No.: US08658517B2Publication Date: 2014-02-25
- Inventor: Issei Satoh , Yuki Seki , Koji Uematsu , Yoshiyuki Yamamoto , Hideki Matsubara , Shinsuke Fujiwara , Masashi Yoshimura
- Applicant: Issei Satoh , Yuki Seki , Koji Uematsu , Yoshiyuki Yamamoto , Hideki Matsubara , Shinsuke Fujiwara , Masashi Yoshimura
- Applicant Address: JP Osaka-shi, Osaka
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi, Osaka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2010-254529 20101115; JP2010-255840 20101116; JP2011-230682 20111020
- International Application: PCT/JP2011/075961 WO 20111110
- International Announcement: WO2012/067015 WO 20120524
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
The present method of manufacturing a GaN-based film includes the steps of preparing a composite substrate, the composite substrate including a support substrate in which a coefficient of thermal expansion in a main surface is more than 0.8 time and less than 1.2 times as high as a coefficient of thermal expansion of GaN crystal in a direction of a axis and a single crystal film arranged on a side of the main surface of the support substrate, the single crystal film having threefold symmetry with respect to an axis perpendicular to a main surface of the single crystal film, and forming a GaN-based film on the main surface of the single crystal film in the composite substrate. Thus, a method of manufacturing a GaN-based film capable of manufacturing a GaN-based film having a large main surface area and less warpage is provided.
Public/Granted literature
- US08697550B2 Method of manufacturing GaN-based film Public/Granted day:2014-04-15
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