The invention relates to a method for configuring a test arrangement for a device to be tested, which is one component of a system containing, several components. The components of the system are described by data records, which have elements that describe relationships of components with one another. The method includes linking the data records to generate a system description based on the linked data records, simulating of the system by a simulation based on the system description, wherein an image of the device to be tested is in the simulation. The method also includes removal of the image of the device from the simulation and provision of one or more test interfaces in hardware for communication between the simulation facility and the device.