Invention Grant
- Patent Title: Test architecture based on intelligent test sequence
- Patent Title (中): 基于智能测试序列的测试架构
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Application No.: US13174475Application Date: 2011-06-30
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Publication No.: US08661293B2Publication Date: 2014-02-25
- Inventor: Francis E. del Rosario , Jie Li , Antoine G. Sater , Hong Ye
- Applicant: Francis E. del Rosario , Jie Li , Antoine G. Sater , Hong Ye
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Yee & Associates, P.C.
- Agent David A. Mims, Jr.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method, data processing system, and computer program product for testing a computer system. A sequencer tests the computer system using test modules arranged in a first sequence, wherein each of the test modules is for testing at least a portion of the computer system. The sequencer determines if an operator is available, in response to an interrupt generated by a test module. If an operator is available, the sequencer arranges the test modules into a second sequence based on a first policy. If an operator is unavailable, the sequencer arranges the test modules into a third sequence based on a second policy.
Public/Granted literature
- US20130007525A1 TEST ARCHITECTURE BASED ON INTELLIGENT TEST SEQUENCE Public/Granted day:2013-01-03
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