Invention Grant
US08661393B2 Method for analyzing placement context sensitivity of standard cells
有权
分析标准细胞放置上下文敏感度的方法
- Patent Title: Method for analyzing placement context sensitivity of standard cells
- Patent Title (中): 分析标准细胞放置上下文敏感度的方法
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Application No.: US13536694Application Date: 2012-06-28
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Publication No.: US08661393B2Publication Date: 2014-02-25
- Inventor: Robert E. Boone , Puneet Sharma , Matthew A. Thompson
- Applicant: Robert E. Boone , Puneet Sharma , Matthew A. Thompson
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Jackson Walker L.L.P.
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A disclosed method for evaluating placement context sensitivity in the design of an integrated circuit includes accessing a standard cell library comprising a database of standard cells and determining generating boundary data for each of the standard cells. The boundary data for a standard cell indicates the layout of features located within boundary regions of the standard cell. The method includes merging or consolidating boundary data for any two standard cells if their boundary data is the same to determine a canonical or minimal set of boundary regions. The disclosed method further includes enumerating and evaluating all combinations of pairs of the canonical boundary regions and, responsive to identifying of a proximity-based sensitivity or exception, modifying, notating, or otherwise remediating the applicable one or more standard cells that correspond to the boundary region combination that raised the exception.
Public/Granted literature
- US20140007029A1 METHOD FOR ANALYZING PLACEMENT CONTEXT SENSITIVITY OF STANDARD CELLS Public/Granted day:2014-01-02
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