A testing system tests or calibrates an electronic test subject while rotating the test subject within a thermally controlled chamber. The testing system includes a stationary thermal chamber, a test subject, testing electronics that receive electronic data from the test subject, and a rotating platform inside the thermal chamber to which both the test subject and the testing electronics are mounted. The testing system further includes a platform cover for the rotatable platform that rotates with the rotatable platform, and exposes the test subject to the temperature inside the thermal chamber and insulates the testing electronics from the temperature inside the thermal chamber.