Devices and techniques are described for automatically calibrating a projector system. The projector system undergoing calibration is coupled to a computing device and an automated positioning platform coupled to a target structure. The computing device acquires images using a calibrated camera of one or more patterns projected by the projector onto the target structure when the target structure is in a plurality of repeatable poses. From these acquired images, intrinsic projector parameters may be determined. Once determined, the parameters may be used to correct images produced by the projector or acquired by the camera which include a projected pattern or portion thereof.