Invention Grant
US08663559B2 Sample analyzer, sample analyzing method, and computer program product
有权
样品分析仪,样品分析方法和计算机程序产品
- Patent Title: Sample analyzer, sample analyzing method, and computer program product
- Patent Title (中): 样品分析仪,样品分析方法和计算机程序产品
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Application No.: US12079825Application Date: 2008-03-28
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Publication No.: US08663559B2Publication Date: 2014-03-04
- Inventor: Masaharu Shibata , Noriyoshi Yoshida
- Applicant: Masaharu Shibata , Noriyoshi Yoshida
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2007-089642 20070329
- Main IPC: G01N15/06
- IPC: G01N15/06

Abstract:
A sample analyzer that includes a sample preparing section operative to aspirate a sample from a sample container and a measuring section operative to prepare a plurality of measurement samples from the aspirated sample. A control unit is configured to sequentially measure the plurality of prepared measurement samples, obtain a plurality of measurement data for the respective measurement samples, and obtain an analysis result of a predetermined item of the sample based on the plurality of measurement data.
Public/Granted literature
- US20080241957A1 Sample analyzer, sample analyzing method, and computer program product Public/Granted day:2008-10-02
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