Invention Grant
- Patent Title: Semiconductor wafer, semiconductor thin film, and method for manufacturing semiconductor thin film devices
- Patent Title (中): 半导体晶片,半导体薄膜以及半导体薄膜器件的制造方法
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Application No.: US12662646Application Date: 2010-04-27
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Publication No.: US08664086B2Publication Date: 2014-03-04
- Inventor: Mitsuhiko Ogihara
- Applicant: Mitsuhiko Ogihara
- Applicant Address: JP Tokyo
- Assignee: Oki Data Corporation
- Current Assignee: Oki Data Corporation
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo, P.C.
- Priority: JP2009-109282 20090428
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
A method for manufacturing a semiconductor thin film device includes: forming a buffer layer on an Si (111) substrate and a single crystal semiconductor layer on the buffer layer; forming an island including the semiconductor layer, buffer layer, and a portion of the substrate; forming a coating layer on the island; etching the substrate along its Si (111) plane to release the island from the substrate, the coating layer serving as a mask; and bonding the released island to another substrate, a released surface of the released island contacting the another substrate. A semiconductor device includes a single crystal semiconductor layer other than Si, which has a semiconductor device formed on a front surface of an Si (111) layer lying in a (111) plane. The layer is bonded to another substrate with a back surface contacting the another substrate or a bonding layer formed on the another substrate.
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