Invention Grant
US08664086B2 Semiconductor wafer, semiconductor thin film, and method for manufacturing semiconductor thin film devices 有权
半导体晶片,半导体薄膜以及半导体薄膜器件的制造方法

  • Patent Title: Semiconductor wafer, semiconductor thin film, and method for manufacturing semiconductor thin film devices
  • Patent Title (中): 半导体晶片,半导体薄膜以及半导体薄膜器件的制造方法
  • Application No.: US12662646
    Application Date: 2010-04-27
  • Publication No.: US08664086B2
    Publication Date: 2014-03-04
  • Inventor: Mitsuhiko Ogihara
  • Applicant: Mitsuhiko Ogihara
  • Applicant Address: JP Tokyo
  • Assignee: Oki Data Corporation
  • Current Assignee: Oki Data Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Rabin & Berdo, P.C.
  • Priority: JP2009-109282 20090428
  • Main IPC: H01L21/30
  • IPC: H01L21/30
Semiconductor wafer, semiconductor thin film, and method for manufacturing semiconductor thin film devices
Abstract:
A method for manufacturing a semiconductor thin film device includes: forming a buffer layer on an Si (111) substrate and a single crystal semiconductor layer on the buffer layer; forming an island including the semiconductor layer, buffer layer, and a portion of the substrate; forming a coating layer on the island; etching the substrate along its Si (111) plane to release the island from the substrate, the coating layer serving as a mask; and bonding the released island to another substrate, a released surface of the released island contacting the another substrate. A semiconductor device includes a single crystal semiconductor layer other than Si, which has a semiconductor device formed on a front surface of an Si (111) layer lying in a (111) plane. The layer is bonded to another substrate with a back surface contacting the another substrate or a bonding layer formed on the another substrate.
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