Invention Grant
- Patent Title: Method of manufacturing a semiconductor structure and separating the semiconductor from a substrate
- Patent Title (中): 制造半导体结构并将半导体与衬底分离的方法
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Application No.: US13310342Application Date: 2011-12-02
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Publication No.: US08664087B2Publication Date: 2014-03-04
- Inventor: Shih-Pang Chang , Hung-Chi Yang , Yu-Jiun Shen
- Applicant: Shih-Pang Chang , Hung-Chi Yang , Yu-Jiun Shen
- Applicant Address: TW Hsinchu
- Assignee: EPISTAR Corporation
- Current Assignee: EPISTAR Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: TW99142037A 20101202
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L21/46

Abstract:
A method of manufacturing a semiconductor structure is disclosed, which includes providing a substrate comprising a bottom surface and a growth surface opposite to the bottom surface; forming a buffer layer comprising a first surface which is not a C-plane substantially parallel with the bottom surface on the growth surface; forming a semiconductor structure on the buffer layer; forming at least one cavity in the buffer layer; extending the cavity along a main extending direction; separating the substrate and the semiconductor structure; wherein the main extending direction is substantially not parallel with the normal direction of the first surface.
Public/Granted literature
- US20120142142A1 METHOD OF MANUFACTURING A SEMICONDUCTOR STRUCTURE Public/Granted day:2012-06-07
Information query
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