Invention Grant
- Patent Title: Frequency measuring apparatus
- Patent Title (中): 频率测量仪
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Application No.: US12783900Application Date: 2010-05-20
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Publication No.: US08664933B2Publication Date: 2014-03-04
- Inventor: Masayoshi Todorokihara
- Applicant: Masayoshi Todorokihara
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2009-123749 20090522
- Main IPC: G01R23/02
- IPC: G01R23/02

Abstract:
A frequency measuring apparatus includes: a counter section adapted to count a signal including a pulse signal for a predetermined time period, and output a binary count value corresponding to a frequency of the signal including the pulse signal; and a low pass filter section adapted to perform a filtering process on the count value, wherein the low pass filter section includes a first stage filter and a second stage filter, the first stage filter is a moving average filter to which the count value is input, and which provides a binary output with a high-frequency component reduced, and the second stage filter performs an average value calculation on the binary output to provide an output with the high-frequency component reduced.
Public/Granted literature
- US08575914B2 Frequency measuring apparatus Public/Granted day:2013-11-05
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