Invention Grant
US08664944B2 Angle measuring system and method for producing an angle measuring system 有权
角度测量系统和角度测量系统的制造方法

  • Patent Title: Angle measuring system and method for producing an angle measuring system
  • Patent Title (中): 角度测量系统和角度测量系统的制造方法
  • Application No.: US12921539
    Application Date: 2009-01-28
  • Publication No.: US08664944B2
    Publication Date: 2014-03-04
  • Inventor: Johann Mitterreiter
  • Applicant: Johann Mitterreiter
  • Applicant Address: DE Traunreut
  • Assignee: Dr. Johannes Heidenhain GmbH
  • Current Assignee: Dr. Johannes Heidenhain GmbH
  • Current Assignee Address: DE Traunreut
  • Agency: Kenyon & Kenyon LLP
  • Priority: DE102008013377 20080310
  • International Application: PCT/EP2009/050935 WO 20090128
  • International Announcement: WO2009/112303 WO 20090917
  • Main IPC: G01B7/14
  • IPC: G01B7/14
Angle measuring system and method for producing an angle measuring system
Abstract:
An angle measuring system includes a first component group and a second component group, the first component group being mounted in a manner allowing rotation about an axis relative to the second component group. The first component group includes a ring having a running surface and an angle scaling. The second component group has a further ring having a further running surface, as well as a sensor for scanning the angle scaling. Rolling elements are arranged between the running surfaces, the angle scaling being applied such that a geometric pattern of the angle scaling in a first region differs from a geometric pattern of the angle scaling in a second region as a function of radial runouts of the running surfaces and/or of the rolling elements.
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