Invention Grant
US08664944B2 Angle measuring system and method for producing an angle measuring system
有权
角度测量系统和角度测量系统的制造方法
- Patent Title: Angle measuring system and method for producing an angle measuring system
- Patent Title (中): 角度测量系统和角度测量系统的制造方法
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Application No.: US12921539Application Date: 2009-01-28
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Publication No.: US08664944B2Publication Date: 2014-03-04
- Inventor: Johann Mitterreiter
- Applicant: Johann Mitterreiter
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Kenyon & Kenyon LLP
- Priority: DE102008013377 20080310
- International Application: PCT/EP2009/050935 WO 20090128
- International Announcement: WO2009/112303 WO 20090917
- Main IPC: G01B7/14
- IPC: G01B7/14

Abstract:
An angle measuring system includes a first component group and a second component group, the first component group being mounted in a manner allowing rotation about an axis relative to the second component group. The first component group includes a ring having a running surface and an angle scaling. The second component group has a further ring having a further running surface, as well as a sensor for scanning the angle scaling. Rolling elements are arranged between the running surfaces, the angle scaling being applied such that a geometric pattern of the angle scaling in a first region differs from a geometric pattern of the angle scaling in a second region as a function of radial runouts of the running surfaces and/or of the rolling elements.
Public/Granted literature
- US20110006758A1 ANGLE MEASURING SYSTEM AND METHOD FOR PRODUCING AN ANGLE MEASURING SYSTEM Public/Granted day:2011-01-13
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