Invention Grant
- Patent Title: Method for fixed pattern noise (FPN) correction
- Patent Title (中): 固定模式噪声(FPN)校正方法
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Application No.: US12151833Application Date: 2008-05-08
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Publication No.: US08665350B2Publication Date: 2014-03-04
- Inventor: John Richardson , John Wallner
- Applicant: John Richardson , John Wallner
- Applicant Address: US CA Westlake Village
- Assignee: AltaSens, Inc.
- Current Assignee: AltaSens, Inc.
- Current Assignee Address: US CA Westlake Village
- Agency: Reed Smith LLP
- Main IPC: H04N9/64
- IPC: H04N9/64

Abstract:
A method for correcting column Fixed Pattern Noise (FPN) in an image sensor offers a compromise between speed and precision for calculating column FPN offsets. The present correction technique is digital, and is applied after the pixel signal voltages have been digitized by an ADC. A first Optical Black (OB) pixel is sampled and compared to a target level. An offset is stored, and an appropriate push-size is determined. Additional OB pixels are sampled and the offset is applied. The push-size is increased or decreased depending upon whether the pixel signal with the applied offset is above or below a target value. This new offset value is written to memory, and the push-size is reduced, and the process is repeated until the last OB pixel has been processed. The resulting offset is applied to the signal pixels in a column. The primary advantage of this approach is that within a single frame, a good estimate of the column offset is made which is not as affected by outlier pixels (such as “hot” or “flashing” pixels).
Public/Granted literature
- US20090278962A1 Method for fixed pattern noise (FPN) correction Public/Granted day:2009-11-12
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