Invention Grant
- Patent Title: Method for measuring light intensity distribution
- Patent Title (中): 光强分布测量方法
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Application No.: US13729522Application Date: 2012-12-28
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Publication No.: US08665429B2Publication Date: 2014-03-04
- Inventor: Kai-Li Jiang , Jun Zhu , Chen Feng , Shou-Shan Fan
- Applicant: Kai-Li Jiang , Jun Zhu , Chen Feng , Shou-Shan Fan
- Applicant Address: CN Beijing TW New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN2012101920647 20120612
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01J1/42

Abstract:
A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array having a top surface. The carbon nanotube array is located in an inert gas environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a radiation light. An imaging element images the radiation light, to obtain an intensity distribution of the light source.
Public/Granted literature
- US20130327937A1 METHOD FOR MEASURING LIGHT INTENSITY DISTRIBUTION Public/Granted day:2013-12-12
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