Invention Grant
US08666473B2 Arrangement and method for influencing and/or detecting magnetic particles and for magnetic resonance imaging
有权
用于影响和/或检测磁性颗粒和用于磁共振成像的装置和方法
- Patent Title: Arrangement and method for influencing and/or detecting magnetic particles and for magnetic resonance imaging
- Patent Title (中): 用于影响和/或检测磁性颗粒和用于磁共振成像的装置和方法
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Application No.: US13266507Application Date: 2010-04-23
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Publication No.: US08666473B2Publication Date: 2014-03-04
- Inventor: Bernhard Gleich
- Applicant: Bernhard Gleich
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09159257 20090430
- International Application: PCT/IB2010/051790 WO 20100423
- International Announcement: WO2010/125510 WO 20101104
- Main IPC: A61B5/05
- IPC: A61B5/05 ; G01R33/12 ; G01N27/72
Abstract:
Magnetic particle imaging allows the imaging of fast tracer dynamics, but there is no native tissue contrast. A combination with MRI solves this issue. However, coil geometries in MPI and MRI differ significantly, making direct use impractical. According to one aspect of the present invention it is proposed to use pre-polarized MRI to overcome these difficulties. Further, methods and arrangements are proposed to achieve MRI imaging with minimal additional hardware.
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