Invention Grant
- Patent Title: Statistical impact analysis machine
- Patent Title (中): 统计影响分析机
-
Application No.: US13143422Application Date: 2009-01-07
-
Publication No.: US08666515B2Publication Date: 2014-03-04
- Inventor: Claes Fornell , Jaesung Cha , Philip Debard Doriot
- Applicant: Claes Fornell , Jaesung Cha , Philip Debard Doriot
- Applicant Address: US MI Ann Arbor
- Assignee: CFI Group USA, LLC
- Current Assignee: CFI Group USA, LLC
- Current Assignee Address: US MI Ann Arbor
- Agency: Harness, Dickey & Pierce, PLC
- International Application: PCT/US2009/030315 WO 20090107
- International Announcement: WO2010/080146 WO 20100715
- Main IPC: G05B13/02
- IPC: G05B13/02

Abstract:
A computer-implemented initial run module processes manifest variable data using computer-defined model specification parameters stored in a database to provide initial estimates of weights that are associated with latent variables. The initial run module employs a unique value-based weighting partial least squares computer-implemented process. A final run module then operates upon the manifest variable data to determine the importance of the predictor values that are then used to control the industrial, manufacturing or commercial process. The final run module implements a unique patient partial least squares regression model utilizing a boosting learning technique.
Public/Granted literature
- US20130110271A1 STATISTICAL IMPACT ANALYSIS MACHINE Public/Granted day:2013-05-02
Information query